作 者:Salam Waley Shneen ;Dina Harith Shaker ;Fatin Nabeel Abdullah
出 处:International Journal of Electrical and Computer Engineering. 2021 ;11(5):3791-3797.doi:10.11591/ijece.v11i5.pp3791-3797
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038385951