作 者:Salome James ;T. Gowri ;G.V. Ramesh Babu 等
出 处:International Journal of Electrical and Computer Engineering. 2017 ;7(5):2674-2682.doi:10.11591/ijece.v7i5.pp2674-2682
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174665