作 者:Hamood Alqourabah ;Amgad Muneer ;Suliman Mohamed Fati
出 处:International Journal of Electrical and Computer Engineering. 2021 ;11(4):2994-3002.doi:10.11591/ijece.v11i4.pp2994-3002
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038385807