作 者:The Anh Nguyen Dinh ;Huy Le Xuan ;Tuan Anh Vu 等
出 处:International Journal of Electrical and Computer Engineering. 2018 ;8(2):917-925.doi:10.11591/ijece.v8i2.pp917-925
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218244546