作 者:Eun Joo Jeong ;Ji Hwan Bae ;Seung Ryul Jeong
出 处:International Journal of Electrical and Computer Engineering. 2015 ;5(4):832-839.doi:10.11591/ijece.v5i4.pp832-839
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218175055