作 者:Fredy Edimer Hoyos ;John Edwin Candelo ;John Alexander Taborda
出 处:International Journal of Electrical and Computer Engineering. 2018 ;8(3):1551-1568.doi:10.11591/ijece.v8i3.pp1551-1568
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218244549