作 者:Julio Bar贸n Velandia ;Jonathan Steven Capera Quintana ;Sebastian Camilo Vanegas Ayala
出 处:International Journal of Electrical and Computer Engineering. 2021 ;11(4):3502-3509.doi:10.11591/ijece.v11i4.pp3502-3509
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038385790