作 者:Md. Armanur Rahman ;J. Hossen ;Venkataseshaiah C 等
出 处:International Journal of Electrical and Computer Engineering. 2018 ;8(3):1854-1862.doi:10.11591/ijece.v8i3.pp%p
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174389