作 者:Mouellef Sihem ;Bentounsi Amar ;Benalla Hocine
出 处:International Journal of Electrical and Computer Engineering. 2015 ;5(5):887-895.doi:10.11591/ijece.v5i5.pp887-895
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174995