作 者:Mini R ;Shabana Backer P. ;B. Hariram Satheesh 等
出 处:International Journal of Electrical and Computer Engineering. 2018 ;8(5):2691-2702.doi:10.11591/ijece.v8i5.pp2691-2702
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174216