作 者:K. Radha ;B.Thirumala Rao ;Shaik Masthan Babu 等
出 处:International Journal of Electrical and Computer Engineering. 2015 ;5(1):158-165.doi:10.11591/ijece.v5i1.pp158-165
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218175128