作 者:T V Rama Krishna ;B T P Madhav ;G Monica 等
出 处:International Journal of Electrical and Computer Engineering. 2016 ;6(4):1725-1731.doi:10.11591/ijece.v6i4.pp1725-1731
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:186756712