作 者:Chanh-Nghiem Nguyen ;Van-Linh Lam ;Phuc-Hau Le 等
出 处:International Journal of Electrical and Computer Engineering. 2022 ;12(1):349-357.doi:10.11591/ijece.v12i1.pp349-357
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038386183