作 者:Talasila Sasidhar ;Vani Havisha ;Sai Koushik 等
出 处:International Journal of Electrical and Computer Engineering. 2016 ;6(3):963-973.doi:10.11591/ijece.v6i3.7943
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:186756628