作 者:Vamsee Krishna Kiran M ;Vimalkumar K ;Vinodhini R E 等
出 处:International Journal of Electrical and Computer Engineering. 2017 ;7(3):1377-1384.doi:10.11591/ijece.v7i3.pp1377-1384
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174790