作 者:Hoang Thien Van ;Vo Tien Anh ;Danh Hong Le 等
出 处:International Journal of Electrical and Computer Engineering. 2021 ;11(5):4135-4142.doi:10.11591/ijece.v11i5.pp4135-4142
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038385909