1.Eminent Inspection of Chip Resistor using Combination of Optimal Edge Detection and Location M Estimation Method

作　　者：Jayesh D. Chauhan ;Kunal J. Pithadiya

出　　处：International Journal of Innovative Research in Science, Engineering and Technology. 2016 ;5(2):1952.doi:10.15680/IJIRSET.2015.0502141

出版社：S&S Publications

文章 ID：174719862

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2.Evaluating the Most Efficient Edge Detection Technique for Inspection of Chip Resistor

作　　者：Kunal J Pithadiya ;Ketan S Patel

出　　处：International Journal of Innovative Research in Computer and Communication Engineering. 2015 ;3(9).doi:10.15680/IJIRCCE.2015. 0309063

出版社：S&S Publications

文章 ID：153306345

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3.An Informal Method of Village Mapping Using Edge Detection Technique& ISRO-BHUVAN Software

作　　者：Kunal J. Pithadiya ;Sunil S. Shah

出　　处：International Journal of Innovative Research in Science, Engineering and Technology. 2016 ;5(4):5642.doi:10.15680/IJIRSET.2016.0504074

出版社：S&S Publications

文章 ID：181616804

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4.Selecting the Most Favourable Edge Detection Technique for Liquid Level Inspection in Bottles

作　　者：Kunal J Pithadiya ;Chintan K Modi ;Jayesh D Chauhan

出　　处：International Journal of Computer Information Systems and Industrial Management Applications. 2011 ;3:34-44.

出版社：Machine Intelligence Research Labs (MIR Labs)

文章 ID：182295936

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	社会学	2篇
	文化、科学、教育、体育	1篇
	计算技术、计算机技术	1篇

	印度	3篇
	美国	1篇

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	Kunal J Pithadiya	2篇
	Kunal J. Pithadiya	2篇
	Chintan K Modi	1篇
	Jayesh D Chauhan	1篇
	Jayesh D. Chauhan	1篇

	International Journal of Innovative Research in Science, Engineering and Technology	2篇
	International Journal of Computer Information Systems and Industrial Management Applications	1篇
	International Journal of Innovative Research in Computer and Communication Engineering	1篇

	2016	2篇
	2015	1篇
	2011	1篇

	Ketan S Patel	1篇
	Sunil S. Shah	1篇